磁気光学
Co2+(4配位)を含むフェライト薄膜の磁気光学効果
1983 年 7 巻 2 号 p. 123-126
詳細
1983 年 7 巻 2 号 p. 123-126
Kerr and Faraday effects in CoCrFe4 films have been measured at λ=0.4−0.9 μm. The films RF-sputter deposited on both quartz glass and Si-wafer substrates. They are about 0.31 μm in thickness and polycrystalline with no preferred orientation. The easy axis of magnetization is directed in plane of the film. The Kerr effect of the film does not show large normal remanence and high coercivity, which differs from the Kerr effect RCD of bulk samples. Since the film is transparent, Faraday rotation θF superposes Kerr rotation θK. Introducing term of ‘effective reflectivity’, the wavelength dependence of the rotation angle θ is consisa tently explained in various experimental configurations.
Figure of merit for θF takes peak values of 2θF/α=1° and 3° at λ=0.62 and 0.71 μm, respectively. Figure of merit for θ (containing θK and θF in a comparable degree) takes maximum value of 2Rθ=0.6° at λ=0.72 μm. These peak values are ascribed to the crystal field transition of the tetrahedrally coordinated Co2+.
