抄録
Thin films of Ptx(MnSb)1-x have been prepared by a rf-sputtering, and have investigated as a new material for magneto-optic applications. Room temperature saturation magnetization (Ms) and coercive force (Hc) for as-sputtered and annealed films are measured using a vibrating sample magnetometer (VSM). The easy axis of magnetization exists in the plane for all films, and the values of Ms and Hc vary with the concentration of Pt in PtMnSb films.
Measurements of polar Kerr rotation θk are performed at a He-Ne laser wavelength (632.8 nm). For the film at x ≅ 0.15, annealed at 500°C for 10 hours in a vacuum, the polar Kerr rotation is found to be 0.9° when an external DC magnetic field 4 kOe is applied in a perpendicular diredtion.
