Characterization of Soft X-Ray Radiation from Plasma Focus Device with Gas Puff

Abstract

Characterization of soft X-ray emission from a plasma focus device with Ar gas puff is carried out. Intensities of the K-shell lines are observed quantitatively and spectroscopically in a single shot. Depending on the delay time between the puffing of the Ar and the main discharge, the generated soft X-ray source in the pinched plasma is divided into two categories, namely filamentary or scattered spot sources. The soft X-ray intensity of the filamentary source is much higher than that of the scattered spot sources. It is observed that the absorption by the surrounding plasma is remarkable. Using an imaging Bragg spectrometer, spatial distributions of soft X-ray images depicted by the H-like Lyα line, the He-like resonance line, the He-like intercombination line and the Li-like dielectronic satellite lines of Ar ions are obtained. It is recognized that the image from Lyα, the other lines and unresolved pinhole image form a nest with a common center. Although the He-like resonance line is especially subject to remarkable absorption, we restored the observed intensity and evaluate the spatial distribution of the electron temperature and the electron density.