1962 年 17 巻 5 号 p. 846-853
The amount of temperature diffuse scattering of X-rays contained in Laue-Bragg spots is calculated for the rotating crystal method. Simple correction formulae are obtained for experiments with Geiger-Müller counters and photographic films. For the (006) reflection of NaCl and the (\bar409) reflection of anthracene, corrections for this effect are estimated to be 8.4% and 28% respectively in typical experimental conditions.
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