Observations of Dislocation Images in Ge by Anomalous Transmission Method

抄録

An arrangement is proposed for X-ray diffraction microscopy using the anomalous transmission effect, in which the photographic plate is placed apart from the crystal in order to separate images due to the Kα doublet. This technique is practically convenient and gives the resolution of the image as high as 6 μ. By this technique, some observations were made on dislocations in Ge single crystals; (i) subsidiary maxima and minima were found along some dislocation images; (ii) dependence of the diffuseness of the image on the distance from the incident surface was studied in detail; (iii) dependence of the intensity contrast on the geometrical relation of Burgers vector to the reflecting net plane was confirmed. Furthermore, dislocation lines were observed in the overlapping region of two different reflections.