Journal of the Physical Society of Japan
Online ISSN : 1347-4073
Print ISSN : 0031-9015
ISSN-L : 0031-9015
Spin-Lattice Relaxation in Compensated n-Type Silicon
Takeo Igo
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1966 年 21 巻 5 号 p. 874-882

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Spin-lattice relaxation rate, 1⁄Ts, of donor electrons in phosphorus and boron doped silicon was studied at liquid helium temperature as a function of the degree of compensation K=NAND (NA, ND: acceptor and donor concentrations). Donor concentrations ranged from approximately 5×1015/cc to 3×1016/cc and the degree of compensation was varied up to 0.8. It was found that 1⁄Ts increased first with increasing K, reached a maximum at around K=0.5∼0.6 depending on ND, and then decreased with a further increase in K. If a power law is assumed for the dependence on temperature T, the relaxation rate goes as Tn, n increasing with K but being independent of ND.
The above experimental results are discussed assuming the hopping of donor electrons. A comparison is made with Sugihara’s theory, which gave a rather satisfactory explanation of the experimental results.
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