Conductance Fluctuation in Small Metallic Wires
1987 年 56 巻 1 号 p. 25-28
詳細
1987 年 56 巻 1 号 p. 25-28
The conductance fluctuation in small metallic systems is sensitive to the sample geometry and the size and position of leads. We formulate the fluctuation by taking into account the sample geometry as a four-terminal network. It is shown that the conductance fluctuation increases dramatically as the distance of the voltage terminals decreases. Recent experimental results for metallic wires support our theoretical prediction.
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