Relationship between Magnetoresistance and Lattice Uncertainty at the Interface in Sputtered Fe/Cr Multilayer Films

抄録

We have investigated the relationship between the magnetoresistance and the paracrystalline disorder of lattice plane spacings at the interface in Fe/Cr multilayer films prepared by rf sputtering. The X-ray linewidths for the (110) and (220) peaks were analysed using a modified paracrystalline theory to obtain the grain size and the lattice uncertainty, which represents the degree of paracrystalline disorder. We have found that the magnetoresistance increases with decreasing lattice uncertainty.