Journal of Surface Analysis
Online ISSN : 1347-8400
Print ISSN : 1341-1756
ISSN-L : 1341-1756
Review
Recent Progress of Cluster Ion Beam Technology And Its Application for Surface Analysis
N. Sanada
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JOURNAL FREE ACCESS

2008 Volume 14 Issue 3 Pages 204-213

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Abstract

  Cluster ions have been increasingly applied to surface analysis of organic and bio materials. Recent progress of cluster ion beam formation, sputtering process of cluster ions, and their application for surface analysis are reviewed.

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© 2008 The Surface Analysis Society of Japan
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