2015 Volume 21 Issue 3 Pages 121-129
Hard X-ray photoemission spectroscopy (HAXPES) is a relatively new technique that has become practically available recently. HAXPES is now attracting much attention from scientific and industrial researchers as a powerful tool for analyzing the electronic states of the material with the probing depth several times deeper than that of the conventional photoemission spectroscopy (PES). In this article, the principle and the characteristic of HAXPES are outlined with several examples of the researches utilizing this technique. Then two HAXPES measurement systems at BL46XU of SPring-8 equipped with different types of electron spectrometer, i.e., VG-Scienta R4000-10 keV and Focus HV-CSA 300/15 are described in detail. We will also give brief explanation for how to use SPring-8 beamlines.
