抄録
White-beam technique (using energy dispersive full spectrum as a probe) such as white-beam X-ray and white-beam neutron are useful for fast and comprehensive visualization of crystal defect and distortions. They are, however, rather difficult to analyze in any qualitative way, and even a qualitative interpretation often requires considerable experience and time. Here, we develop a white-beam electron technique to characterize nanomaterials without the influence of underlying substrate signals. In this new method, we have extended such “white-beam” concept to electron beam techniques, and employ such white-beam electrons (white electrons) to extract quantitative information of target nanomaterial with extremely high efficiency. Such attempt is a novel application and extension of the conventional white-beam technique, and possibly lead to further utilization of electron beam technique.
