Journal of Surface Analysis
Online ISSN : 1347-8400
Print ISSN : 1341-1756
ISSN-L : 1341-1756
Extended Abstracts from 8th International Symposium on Practical Surface Analysis (PSA19)
Improvement of mapping quality by reflection of a laser beam in Resonance-SNMS
Yuzuka Ohmori, Yuta Miyashita, Yue Zhao, Masato Morita, Tetsuo Sakamoto , Kotaro Kato, Vilker Sonnenschein, Hideki Tomita, Toshihide Kawai, Takeo Okumura, Yukihiko Satou, Masabumi Miyabe, Ikuo Wakaida
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2019 Volume 26 Issue 2 Pages 204-205

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Abstract
Resonant ionization laser spattered neutral mass spectrometry (R-SNMS) is a method of surface analysis. Since the sputtered neutral particles emitted having certain angular distribution, the wavelength (Doppler) shift will be occurred. Therefore, angularly spread particles cannot be ionized by the resonant laser due to the Doppler shift. In this study, we improved the mapping quality of R-SNMS and coped the Doppler shift by using a reflected laser beam.
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© 2019 by The Surface Analysis Society of Japan
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