Abstract
In the XPS analysis of developed carbon-based battery materials, a stable C 1s spectrum could not be obtained with a general sample holding method . We consider that differential charging was the cause because of the non-uniformity of the sample. As charge correction using C 1s was difficult in the case of carbon materials, we investigated new sample holding method and charge correction using standards simultaneously. As a result, we developed a new method in which the sample was coated to the surface of a ZrO2 disk pellet for XPS measurement.
