We report an automated preprocessing method for extracting analysis regions from measured spectral data interpreted by the power law using segment regression. By applying segment regression to spectra, it is possible to obtain the characteristics of the change points and the slopes before and after the change points in the spectrum. By evaluating and judging these features, the analysis region can be automatically extracted. An example of analysis applying this method to a photoelectron yield spectrum with a power law characteristic is shown.

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In the XPS analysis of developed carbon-based battery materials, a stable C 1s spectrum could not be obtained with a general sample holding method . We consider that differential charging was the cause because of the non-uniformity of the sample. As charge correction using C 1s was difficult in the case of carbon materials, we investigated new sample holding method and charge correction using standards simultaneously. As a result, we developed a new method in which the sample was coated to the surface of a ZrO₂ disk pellet for XPS measurement.

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We performed dynamic EBSD measurements on a copper plate under tension, compression, bending, and heating. And we observed the dynamic change behavior of crystal orientation with each method.
We confirmed following things, the relationship between the tensile direction and crystal orientation affects the tensile behavior, soft copper plates exhibit greater susceptibility to distortion during compression compared with hard copper plates, distortion occurs along grain boundaries when bent and suddenly grain size growth occurs when raised to a certain temperature. We also found that when a hard copper plate is bent, distortion occurs first on the outside and then on the inside, that on inside. Also, upon heating, certain additive elements migrate toward the surface..

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In this article, we will describe the method for calculating the electron inelastic mean free path (IMFP) in solids using the single pole approximation (SPA) proposed by Penn. The SPA is relatively straightforward to compute, easy to program, and simple to use. In surface quantitative analyses employing Auger Electron Spectroscopy (AES) and X-ray Photoelectron Spectroscopy (XPS) with relative sensitivity factors, the energy ranges targeted are often above 150 eV or 200 eV. The SPA-derived IMFP results (SPA-IMFP) are reported in Penn's original paper to coincide with those calculated by the Full Penn Algorithm (FPA-IMFP) within a 3 % error for energy regions above 200 eV; however, a detailed comparison has not been conducted. The practicality of SPA-IMFP will significantly increase once its applicable energy range and the error range relative to FPA-IMFP are established. To this end, separate computation programs were developed for the two algorithms to verify the consistency between SPA and FPA calculations across 41 types of elemental solids (Li, Be, C (graphite), C (diamond), C(glassy), Na, Mg, Al, Si, K, Sc, Ti, V, Cr, Fe, Co, Ni, Cu, Ge, Y, Nb, Mo, Ru, Rh, Pd, Ag, In, Sn, Cs, Gd, Tb, Dy, Hf, Ta, W, Re, Os, Ir, Pt, Au, Bi). If a 5 % discrepancy relative to FPA is acceptable, then the SPA can be used to calculate IMFP in the energy range of 200 eV to 10 keV. In this energy range, the third quartile for the 41 elemental solids was below 4 %.

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[in Japanese]

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