1993 Volume 55 Issue 2 Pages 93-100
Noncontact measurement system for plant leaf elongation and leaf area was constructed by the use of image processing devices, and suitable algorithms were developed. The measuring accuracy was checked by experiments with a modeled leaf, and was confirmed less than 65% of resolution error of digital image. This high performance was based on efficincy of the developed algorithms. To evaluate abaptability of the developed system, growth process of the third leaf of rice plant (Oryza Sativa L.) was analyzed under the condition that environmental temperature was only varied periodically.
