The 61st JSAP Spring Meeting 2014
Session ID : 19p-E8-6
Conference information
Host: The Japan Society of Applied Physics
Name : JSAP Spring Meeting
Number : 61
Location : [in Japanese]
Date : March 17, 2014 - March 20, 2014
Analysis of Degradation Mechanism on Bottom Gate Amorphous InGaZnO Thin-Film Transistors with Siloxane Passivation Layer
*Chaiyanan Kulchaisit, Yasuaki Ishikawa, Yoshihiro Ueoka, Bermundo Juan Paolo, Masahiro Horita, Yukiharu Uraoka
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