JSAP Annual Meetings Extended Abstracts
Online ISSN : 2436-7613
The 61st JSAP Spring Meeting 2014
Session ID : 19p-D9-13
Conference information

Characterization of Electron Emission from High Density Self-aligned Si-based Quantum Dots by Conducting-Probe Atomic Force Microscopy (II)
*Daichi TakeuchiKatsunori MakiharaAkio OhtaMitsuhisa IkedaSeiichi Miyazaki
Author information
Keywords: 19p-D9-13
CONFERENCE PROCEEDINGS FREE ACCESS

Details
Article 1st page
Content from these authors
© 2014 The Japan Society of Applied Physics
Previous article Next article
feedback
Top