JSAP Annual Meetings Extended Abstracts
Online ISSN : 2436-7613
The 62nd JSAP Spring Meeting 2015
Session ID : 13p-P17-14
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Electrical Characterization of MOCVD-GaN:Si films with Ar+ Ion Bombardment
*Yoshitaka NakanoKenji TakagiDaisuke OgawaKeiji NakamuraNiibe MasahitoRetsuo Kawakami
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© 2015 The Japan Society of Applied Physics
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