The 62nd JSAP Spring Meeting 2015
Session ID : 13p-B4-7
Conference information
Host: The Japan Society of Applied Physics
Name : JSAP Spring Meeting
Number : 62
Location : [in Japanese]
Date : March 11, 2015 - March 14, 2015
Effect of NO Annealing on Flatband Voltage Instability in SiC MOS Devices
*Yoshihito Katsu, Takuji Hosoi, Yuichiro Nanen, Tsunenobu Kimoto, Takayoshi Shimura, Heiji Watanabe
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Article 1st page
