The 62nd JSAP Spring Meeting 2015
Session ID : 13p-B4-6
Conference information
Host: The Japan Society of Applied Physics
Name : JSAP Spring Meeting
Number : 62
Location : [in Japanese]
Date : March 11, 2015 - March 14, 2015
Failure mechanism analysis of 4H-SiC MOSFETs under high temperature bias test
*Kosuke Uchida, Toru Hiyoshi, Taro Nishiguchi, Hirofumi Yamamoto, Shinji Matsukawa, Masaki Furumai, Yasuki Mikamura
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