The 76th JSAP Autumn Meeting 2015
Session ID : 15a-4E-1
Conference information
Host: The Japan Society of Applied Physics
Name : JSAP Autumn Meeting
Number : 76
Location : [in Japanese]
Date : September 13, 2015 - September 16, 2015
X-ray phase scanner using Talbot-Lau interferometry for non-destructive testing
*Shivaji Bachche, Masahiro Nonoguchi, Koichi Kato, Masashi Kageyama, Takafumi Koike, Masaru Kuribayashi, Atsushi Momose
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