The 76th JSAP Autumn Meeting 2015
Session ID : 15a-4E-4
Conference information
Host: The Japan Society of Applied Physics
Name : JSAP Autumn Meeting
Number : 76
Location : [in Japanese]
Date : September 13, 2015 - September 16, 2015
The new X-ray two-dimensional detector that has the ability of discrimination of sub-micron ~ nano size (Part 1)
*Hiroyoshi Soejima, Toshiyuki Kakihara, Toshiharu Ai, Kuniyoshi Mori, Hiroyuki Watanabe
Author information
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Article 1st page
