The 63rd JSAP Spring Meeting 2016
Session ID : 20p-W323-13
Conference information
Host: The Japan Society of Applied Physics
Name : JSAP Spring Meeting
Number : 63
Location : [in Japanese]
Date : March 19, 2016 - March 22, 2016
Thermal conductivity measurement of thermoelectric thin film using versatility extended 2ω method
*Ryo Okuhata, Kentaro Watanabe, Satoaki Ikeuchi, Akihiro Ishida, Yoshiaki Nakamura
Author information
Details
Article 1st page
