JSAP Annual Meetings Extended Abstracts
Online ISSN : 2436-7613
The 63rd JSAP Spring Meeting 2016
Session ID : 21a-W541-10
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Constant capacitance DLTS measurements of MOCVD n-GaN with high ratios of Nt/Nd
*Shougo UedaKazuki MiyamotoYutaka Tokuda
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Keywords: 21a-W541-10, GaN, Nt/Nd
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© 2016 The Japan Society of Applied Physics
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