JSAP Annual Meetings Extended Abstracts
Online ISSN : 2436-7613
The 63rd JSAP Spring Meeting 2016
Session ID : 22a-W541-1
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Estimation of ALD-HfO2/AlGaN interface with post-deposition annealing by X-ray photoelectron spectroscopy using synchrotron radiation
*Toshiharu KuboGosuke NishinoTakashi Egawa
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© 2016 The Japan Society of Applied Physics
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