The 63rd JSAP Spring Meeting 2016
Session ID : 21p-P10-12
Conference information
Host: The Japan Society of Applied Physics
Name : JSAP Spring Meeting
Number : 63
Location : [in Japanese]
Date : March 19, 2016 - March 22, 2016
Improvement in electrical characteristics of 4H-SiC/Si HBTs due to annealing
Details
Article 1st page
