The 63rd JSAP Spring Meeting 2016
Session ID : 21p-P10-13
Conference information
Host: The Japan Society of Applied Physics
Name : JSAP Spring Meeting
Number : 63
Location : [in Japanese]
Date : March 19, 2016 - March 22, 2016
First-principles analysis on defect level distribution at 4H-SiC(0001)/SiO2
*Tomoaki Kaneko, Takahiro Yamasaki, Nobuo Tajima, Jun Nara, Tatsuo Schimizu, Koichi Kato, Takahisa Ohno
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