JSAP Annual Meetings Extended Abstracts
Online ISSN : 2436-7613
The 77th JSAP Autumn Meeting 2016
Session ID : 14p-P9-4
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Interface Characterization of SiC Schottky Junctions with Laminated Mo/C Electrodes by XPS Measurement
*Tomoyuki SuzukiHitoshi WakabayashiKazuo TsutsuiHiroshi IwaiKuniyuki KakushimaHiroshi Nohira
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© 2016 The Japan Society of Applied Physics
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