The 77th JSAP Autumn Meeting 2016
Session ID : 14p-P9-5
Conference information
Host: The Japan Society of Applied Physics
Name : JSAP Autumn Meeting
Number : 77
Location : [in Japanese]
Date : September 13, 2016 - September 16, 2016
Mapping of interfacial reaction of Ni/n-SiC Schottky contacts using scanning internal photoemission microscopy
Keywords:
14p-P9-5,
scanning internal photoemission microscopy,
SiC Schottky contacts,
thermal degradation
Details
Article 1st page
