JSAP Annual Meetings Extended Abstracts
Online ISSN : 2436-7613
The 65th JSAP Spring Meeting 2018
Session ID : 17p-P8-20
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RTN Impact on Data-Retention Failure/Recovery Mechanism in Sub-20nm NAND Flash Memories
*Kyoji MizoguchiTomonori TakahashiKen Takeuchi
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© 2018 The Japan Society of Applied Physics
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