The 79th JSAP Autumn Meeting 2018
Session ID : 21p-232-1
Conference information
Host: The Japan Society of Applied Physics
Name : JSAP Autumn Meeting
Number : 79
Location : [in Japanese]
Date : September 18, 2018 - September 21, 2018
Detection of defects inducing large leakage current of diamond diodes
*Takehiro Shimaoka, Kimiyoshi Ichikawa, Kenji Watanabe, Satoshi Koizumi, Tokuyuki Teraji
Author information
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