The 79th JSAP Autumn Meeting 2018
Session ID : 20p-233-5
Conference information
Host: The Japan Society of Applied Physics
Name : JSAP Autumn Meeting
Number : 79
Location : [in Japanese]
Date : September 18, 2018 - September 21, 2018
Helium ion microscopy (HIM) for imaging fine line features patterned organic film with less damage
Details
Article 1st page
