The 79th JSAP Autumn Meeting 2018
Session ID : 21p-133-6
Conference information
Host: The Japan Society of Applied Physics
Name : JSAP Autumn Meeting
Number : 79
Location : [in Japanese]
Date : September 18, 2018 - September 21, 2018
ElucidationAnalysis of potential induced degradation at the micro-cracked regions for p-type crystalline Si solar cells using microwave photoconductance decay technique
Keywords:
21p-133-6,
potential induced degradation,
silicon solar cell,
microwave photoconductance decay (u-PCD)
Details
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