ElucidationAnalysis of potential induced degradation at the micro-cracked regions for p-type crystalline Si solar cells using microwave photoconductance decay technique

Dong Chung Nguyen; Yasuaki Ishikawa; Yukiharu Uraoka

doi:10.11470/jsapmeeting.2018.2.0_3551

The 79th JSAP Autumn Meeting 2018

セッションID: 21p-133-6

DOI https://doi.org/10.11470/jsapmeeting.2018.2.0_3551

会議情報

主催: The Japan Society of Applied Physics

会議名: 応用物理学会秋季学術講演会

回次: 79

開催地: 名古屋国際会議場

開催日: 2018/09/18 - 2018/09/21

ElucidationAnalysis of potential induced degradation at the micro-cracked regions for p-type crystalline Si solar cells using microwave photoconductance decay technique

*Dong Chung Nguyen, Yasuaki Ishikawa, Yukiharu Uraoka

著者情報

キーワード: 21p-133-6, potential induced degradation, silicon solar cell, microwave photoconductance decay (u-PCD)

会議録・要旨集フリー

詳細

責任著者(Corresponding author)

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