The 79th JSAP Autumn Meeting 2018
Session ID : 19a-311-6
Conference information
Host: The Japan Society of Applied Physics
Name : JSAP Autumn Meeting
Number : 79
Location : [in Japanese]
Date : September 18, 2018 - September 21, 2018
Gated Four-Probe Method for Evaluation of Electrical Characteristics in MoS2 Field-Effect Transistors
Details
Article 1st page
