The 80th JSAP Autumn Meeting 2019
Session ID : 20a-B31-7
Conference information
Host: The Japan Society of Applied Physics
Name : JSAP Autumn Meeting
Number : 80
Location : [in Japanese]
Date : September 18, 2019 - September 21, 2019
Degradation phenomenon of reliability in high mobility oxide thin-film transistor
*Takanori Takahashi, Mami N. Fujii, Miki Miyanaga, Juan Paolo Bermundo, Yasuaki Ishikawa, Yukiharu Uraoka
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