JSAP Annual Meetings Extended Abstracts
Online ISSN : 2436-7613
The 67th JSAP Spring Meeting 2020
Session ID : 12p-PA5-13
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Simultaneous measurement of noise and bias stress of organic transistor
*Satomi HasegawaTomohide UenoTakashi FukudaShizuo TokitoHiroyuki Matsui
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© 2020 The Japan Society of Applied Physics
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