JSAP Annual Meetings Extended Abstracts
Online ISSN : 2436-7613
The 67th JSAP Spring Meeting 2020
Session ID : 15a-A305-10
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Characteristics of slow traps in Al2O3/GeOx/n-Ge MOS interfaces by plasma oxidation
*Mengnan KeMitsuru TakenakaShinichi Takagi
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© 2020 The Japan Society of Applied Physics
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