JSAP Annual Meetings Extended Abstracts
Online ISSN : 2436-7613
The 67th JSAP Spring Meeting 2020
Session ID : 15a-A305-11
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Proposal of a measurement method to discriminate different types of traps in n-Ge MOS gate nsulators
*Mengnan KeMitsuru TakenakaShinichi Takagi
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© 2020 The Japan Society of Applied Physics
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