JSAP Annual Meetings Extended Abstracts
Online ISSN : 2436-7613
The 67th JSAP Spring Meeting 2020
Session ID : 15a-A305-12
Conference information

Comparison of carrier trap characteristics in different interfacial layers of n-Ge MOS structures
*Mengnan KeMitsuru TakenakaShinichi Takagi
Author information
CONFERENCE PROCEEDINGS FREE ACCESS

Details
Article 1st page
Content from these authors
© 2020 The Japan Society of Applied Physics
Previous article Next article
feedback
Top