The 67th JSAP Spring Meeting 2020
Session ID : 14a-B401-4
Conference information
Host: The Japan Society of Applied Physics
Name : JSAP Spring Meeting
Number : 67
Location : [in Japanese]
Date : March 12, 2020 - March 15, 2020
Depth profiling of deep-level traps in GaN introduced by high-temperature thermal treatment with SiN cap layer
Details
Article 1st page
