JSAP Annual Meetings Extended Abstracts
Online ISSN : 2436-7613
The 67th JSAP Spring Meeting 2020
Session ID : 14p-B401-16
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Reduction of contact resistance of ALD-Al2O3 diamond MOSFETs by selective regrowth high concentration boron doped layer;Drain current density | IDS | > 1 A/mm
*Yukiko SuzukiShoichiro ImanishiKen KudaraKiyotaka HorikawaShotaro AmanoMasayuki IwatakiAoi MorishitaAtsushi HiraiwaHiroshi Kawarada
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© 2020 The Japan Society of Applied Physics
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