JSAP Annual Meetings Extended Abstracts
Online ISSN : 2436-7613
The 68th JSAP Spring Meeting 2021
Session ID : 17a-Z28-10
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Evaluation of the effect of the ion implantation process on carrier lifetimes in 4H-SiC SJ-UMOSFET
*Takuya FukuiTakeshi TawaraMasashi Kato
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© 2021 The Japan Society of Applied Physics
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