JSAP Annual Meetings Extended Abstracts
Online ISSN : 2436-7613
The 68th JSAP Spring Meeting 2021
Session ID : 19a-Z33-8
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Stacking Faults Generated from Micro Particles-Origin of Leakage Current in HVPE (001) beta-Gallium Oxide Epilayers Determined by High-Sensitive Emission Microscope
*Makoto KasuSayleap SdoeungKohei SasakiSatoshi MasuyaKatsumi KawasakiJun HirabayashiAkito Kuramata
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© 2021 The Japan Society of Applied Physics
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