JSAP Annual Meetings Extended Abstracts
Online ISSN : 2436-7613
The 68th JSAP Spring Meeting 2021
Session ID : 19a-Z33-7
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Polycrystalline Defects Origin of Reverse Leakage Current in HVPE (001) β-Ga2O3 SBDs Identified by High Sensitive Emission Microscope
*Sayleap SdoeungKohei SasakiKatsumi KawasakiJun HirabayashiAkito KuramataMakoto Kasu
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© 2021 The Japan Society of Applied Physics
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