The 69th JSAP Spring Meeting 2022
Session ID : 24a-E302-9
Conference information
Host: The Japan Society of Applied Physics
Name : JSAP Spring Meeting
Number : 69
Location : [in Japanese]
Date : March 22, 2022 - March 26, 2022
Characterization for trap states of SiO2/GaN interfaces and SiO2 films by DLTS
*Shingo Ogawa, Hidetoshi Mizobata, Takuma Kobayashi, Takayoshi Shimura, Heiji Watanabe
Author information
Details
Article 1st page
