Time-domain reflectometry of electronic devices

抄録

Time-domain reflectometry is an electrical measurement that utilizes the reflected waves of high-frequency electrical signals from portions where impedances are not matched in the high-frequency transmission paths. In the past, it has been used for large-scale measurements such as geological surveys. However, in recent years, technological advances have made it possible to perform small-scale measurements such as LSI quality diagnosis. We adopted this measurement to observe the carrier dynamics in electronic devices by measuring the transient impedance. This paper presents the results of a time-resolved analysis of organic thin-film transistors and organic solar cells.