Cu/ZrO₂界面における鏡像電荷相互作用のコンピューター・シミュレーション

抄録

Image charge interaction reported by Ishii et. al.¹ at Cu/Y₂O₃-fully stabilized cubic ZrO₂ interfaces produced in the thermal evaporation method, was reproduced on a personal computer simply with classical electrodynamics. The difference in the interfacial adhesion force was observed between continuum/ZrO₂ (110) (a neutral plane) and continuum/ZrO₂ (001) (polarized plane) even if no quantum mechanical computation was done. Continuum/ZrO₂ (001) showed stronger adhesion force than that of continuum/ZrO₂ (001) at large interfacial interval. This result indicates that the image charge interaction works in a long range.