抄録
In a series system, the system fails if any of the components fails. When the system functions, there may exist correlation among components because they are connected within the same system. In this paper, we consider the reliability analysis of Type-I censored life tests of series systems composed of two components with bivariate log-normal lifetime distribution. The major interest is the inference on the mean lifetimes, and the reliability functions of the system as well as components. It is interesting to discover that conventional statistical inference based on the model parameters may yield unreliable results, especially through the maximum likelihood method. Alternatively, we apply the Bayesian approach focused on the likelihood function of the the mean lifetimes after reparametrization. The results are shown to be more promising via simulation study.
