寿命分布に一般化パレート分布を仮定したときの温度劣化最適試験法(セッション5A 一般セッション)

抄録

The Arrhenius-log-normal model has been used, in general, for the deterioration model due to the thermal stress. The Arrhenius law is based on the chemical reaction theory between the absolute temperature and the activity of materials. In the International Electrotechnical Commission 60216-1, the deterioration due to the thermal stress is represented by using the mechanical strength, and the time showing 50% mechanical strength to the initial strength is defined as the failure time. We assume here the generalized Pareto distribution model for such a model. Combining the Arrhenius law with the generalized Pareto distribution model, we have discussed the optimal allocation of test specimens using simulation study.